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Specifications of IEC61032 Test Probe 18 probe 19

日期:2025-05-11 13:25
瀏覽次數(shù):674
摘要: Specifications of IEC61032 Test Probe 18 probe 19 Jointed Test 19 is intended to simulate access to hazardous parts by children of 36 months or less Jointed test probe 18 is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years. Technology Parameter Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc. Test probe 19 : Knurled finger di

Specifications of IEC61032 Test Probe 18 probe 19

 

Jointed  Test 19 is intended to simulate access to hazardous parts by children of 36 months or less

 

Jointed test probe 18 is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.

 

Technology Parameter

Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc.

 

Test probe 19 :

Knurled finger diameter: 5.6mm   

Head radius: 2.8mm

Knurled finger length: 44mm

 

 

Test probe 18 :

Knurled finger diameter: 8.6mm   

Head radius: 4.3mm

Knurled finger length: 57.9mm


 

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